19 search results - page 3 / 4 » glvlsi 2008 |
GLVLSI
2008
IEEE
13 years 7 months ago
2008
IEEE
The main contribution of this work is an analytical model for finding the upper bound on the temperature difference among various locations on the die. The proposed model can be u...
GLVLSI
2008
IEEE
13 years 6 months ago
2008
IEEE
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
GLVLSI
2008
IEEE
14 years 26 days ago
2008
IEEE
Due to the large contribution of the memory subsystem to total system power, the memory subsystem is highly amenable to customization for reduced power/energy and/or improved perf...
GLVLSI
2008
IEEE
14 years 26 days ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
GLVLSI
2008
IEEE
14 years 26 days ago
2008
IEEE
Novel nano-scale devices have shown promising potential to overcome physical barriers faced by complementary metaloxide semiconductor (CMOS) technology in future circuit design. H...