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ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
44
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ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity...
ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
We consider two versions of the problem of folding a stack of equal width components. In both versions, when a stack is folded, a routing penalty is incurred at the fold. In one v...
ICCAD
1994
IEEE
15 years 2 months ago
1994
IEEE
We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...