43 search results - page 5 / 9 » iccad 1998 |
98
Voted
ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
106
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ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
95
Voted
ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
In this paper, we propose a high-level variable selection for partial-scan approach to improve the testability of digital systems. The testability of a design is evaluated at the ...
ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
Combinational verification is an important piece of most equivalence checking tools. In the recent past, many combinational verification algorithms have appeared in the literature...
101
click to vote
ICCAD
1998
IEEE
15 years 6 months ago
1998
IEEE
Increases in delay due to coupling can have a dramatic impact on IC performance for deep submicron technologies. To achieve maximum performance there is a need for analyzing logic...