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ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...
ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
––In this paper, a corner block list — a new efficient topological representation for non-slicing floorplan is proposed with applications to VLSI floorplan and building block...
ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
—As the complexity of digital filters is dominated by the number of multiplications, many works have focused on minimizing the complexity of multiplier blocks that compute the co...
ICCAD
2000
IEEE
15 years 2 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
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ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
In macromodeling-based power estimation, circuit macromodels are created from simulations of synthetic input vector sequences. Fast generation of these sequences with all possible...