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ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
A novel circuit topology for inductive coupling between interconnecting wires is presented. The model is local, i.e., only coupling between neighboring wires is explicitly modeled...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
Future high performance microprocessor design with technology scaling beyond 90nm will pose two major challenges: (1) energy and power, and (2) parameter variations. Design practi...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
Approaches to achieve low-power and high-speed VLSI's are described with the emphasis on techniques across multiple technology and design levels. To suppress the leakage curr...
ICCAD
2002
IEEE
15 years 2 months ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...