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ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
15 years 2 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
98
Voted
ICCAD
2003
IEEE
193views Hardware» more  ICCAD 2003»
15 years 2 months ago
FROSTY: A Fast Hierarchy Extractor for Industrial CMOS Circuits
: This paper presents FROSTY, a computer program for automatically extracting the hierarchy of a large-scale digital CMOS circuit from its transistor-level netlist description and ...
Lei Yang, C.-J. Richard Shi
ICCAD
2003
IEEE
158views Hardware» more  ICCAD 2003»
15 years 6 months ago
Approaching the Maximum Energy Saving on Embedded Systems with Multiple Voltages
Dynamic voltage scaling (DVS) is arguably the most effective energy reduction technique. The multiple-voltage DVS systems, which can operate only at pre-determined discrete voltag...
Shaoxiong Hua, Gang Qu
ICCAD
2003
IEEE
161views Hardware» more  ICCAD 2003»
15 years 6 months ago
A General S-Domain Hierarchical Network Reduction Algorithm
This paper presents an efficient method to reduce complexities of a linear network in s-domain. The new method works on circuit matrices directly and reduces the circuit complexi...
Sheldon X.-D. Tan
ICCAD
2003
IEEE
152views Hardware» more  ICCAD 2003»
15 years 6 months ago
Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
Phillip Stanley-Marbell, Diana Marculescu