Abstract—The design of integrated circuits involves the consideration of a large number of constraints of various types. In addition to the definition of these constraints in a ...
This paper studies TSV-to-TSV coupling in 3D ICs. A full-chip SI analysis flow is proposed based on the proposed coupling model. Analysis results show that TSVs cause significan...
Chang Liu, Taigon Song, Jonghyun Cho, Joohee Kim, ...
This work studies distributed linear transmission strategies for the multiple-input multiple-output (MIMO) interference channel with multiple concurrent links. We introduce the no...
Jianqi Wang, Amitav Mukherjee, A. Lee Swindlehurst
In this work, we propose an efficient and accurate full-chip thermomechanical stress and reliability analysis tool and design optimization methodology to alleviate mechanical rel...
Moongon Jung, Joydeep Mitra, David Z. Pan, Sung Ky...
—Pre-bond testing of 3-D stacked integrated circuits (ICs) involves testing each individual die before bonding. The overall yield of 3-D ICs improves with pre-bond testability be...
Xin Zhao, Dean L. Lewis, Hsien-Hsin S. Lee, Sung K...