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135

ATS
2000
IEEE

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An adjacency-based test pattern generator for low power BIST design

15 years 10 months ago

An adjacency-based test pattern generator for low power BIST design

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Patrick Girard, Loïs Guiller, Christian Landr...

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117

ATS
2000
IEEE

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Functional Testing of Microprocessors with Graded Fault Coverage

15 years 10 months ago

Functional Testing of Microprocessors with Graded Fault Coverage

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Rajesh Kannah, C. P. Ravikumar

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111

ATS
2000
IEEE

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Fast hierarchical test path construction for DFT-free controller-datapath circuits

15 years 10 months ago

Fast hierarchical test path construction for DFT-free controller-datapath circuits

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Yiorgos Makris, Jamison Collins, Alex Orailoglu

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116

BMAS
2000
IEEE

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Characterization, Simulation and Modeling of PLL under Irradiation Using HDL-A

15 years 10 months ago

Characterization, Simulation and Modeling of PLL under Irradiation Using HDL-A

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I. Martínez, P. Delatte, D. Flandre

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289

CA
2000
IEEE

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Computer Animation: Algorithms and Techniques - A Historical Review

15 years 10 months ago

Computer Animation: Algorithms and Techniques - A Historical Review

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Richard E. Parent

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