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ISCA
2008
IEEE
14 years 10 months ago
2008
IEEE
There is an increasing need for new Web server architectures that are application-centric, simple, small, and pervasive in nature. In this paper, we present a novel architecture f...
TCAD
2002
14 years 9 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
DELTA
2008
IEEE
15 years 4 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
ISCA
2008
IEEE
14 years 10 months ago
2008
IEEE
Network-on-Chip (NoC) architectures have been adopted by a growing number of multi-core designs as a flexible and scalable solution to the increasing wire delay constraints in the...
ICCAD
2008
IEEE
15 years 6 months ago
2008
IEEE
—Hardware Intellectual Property (IP) cores have emerged as an integral part of modern System–on–Chip (SoC) designs. However, IP vendors are facing major challenges to protect...