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159
Voted
ITC
1996
IEEE
432views Hardware» more  ITC 1996»
15 years 10 months ago
Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms
Anthony Taylor, Gregory A. Maston
114
Voted
ITC
1996
IEEE
78views Hardware» more  ITC 1996»
15 years 10 months ago
Identification and Test Generation for Primitive Faults
Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad...
ITC
1996
IEEE
94views Hardware» more  ITC 1996»
15 years 10 months ago
An ATPG-Based Framework for Verifying Sequential Equivalence
Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, ...
149
Voted
ITC
1996
IEEE
114views Hardware» more  ITC 1996»
15 years 10 months ago
A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
139
Voted
ITC
1996
IEEE
96views Hardware» more  ITC 1996»
15 years 10 months ago
A Roadmap for Boundary-Scan Test Reuse
This paper proposes a Layered Model for boundaryscan testing to help identify opportunities for standardization. Serial Vector Format [1] and an accompanying Application Programmi...
D. Eugene Wedge, Tom Conner