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ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
This paper proposes an environment to address Testability Analysis and Test Pattern Generation on VHDL descriptions at the RT-level. The proposed approach, based on a suitable fau...