18 search results - page 2 / 4 » itc 1997 |
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points and on IDD switching transients on the sup...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...