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ITC
1998
IEEE

79views Hardware» more ITC 1998»

An almost full-scan BIST solution-higher fault coverage and shorter test application time

13 years 10 months ago

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Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng

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ITC
1998
IEEE

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A fault injection environment for microprocessor-based boards

13 years 10 months ago

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Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo...

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ITC
1998
IEEE

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Novel optical probing technique for flip chip packaged microprocessors

13 years 10 months ago

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Mario Paniccia, Travis M. Eiles, V. R. M. Rao, Wai...

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ITC
1998
IEEE

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A tree-structured LFSR synthesis scheme for pseudo-exhaustive testing of VLSI circuits

13 years 10 months ago

Download cad63.cs.nthu.edu.tw

Wen-Ben Jone, Jiann-Chyi Rau, Shih-Chieh Chang, Yu...

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ITC
1998
IEEE

66views Hardware» more ITC 1998»

A novel combinational testability analysis by considering signal correlation

13 years 10 months ago

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