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ITC
1998
IEEE
71views Hardware» more  ITC 1998»
13 years 10 months ago
A structured and scalable mechanism for test access to embedded reusable cores
The main objective of core-based IC design is improvement of design efficiency and time-to-market. In order to prevent test development from becoming the bottleneck in the entire ...
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard...
ITC
1998
IEEE
94views Hardware» more  ITC 1998»
13 years 10 months ago
A method of serial data jitter analysis using one-shot time interval measurements
A method for measuring inter-symbol interference, duty cycle distortion, random jitter and periodic jitter is described. The Blackman-Tukey method of signal analysis is used. This...
Jan B. Wilstrup
ITC
1998
IEEE
120views Hardware» more  ITC 1998»
13 years 10 months ago
Test generation in VLSI circuits for crosstalk noise
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
ITC
1998
IEEE
174views Hardware» more  ITC 1998»
13 years 10 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong