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    ITC
    1999
    IEEE
    82views Hardware» more  ITC 1999»
    Testing a system-on-a-chip with embedded microprocessor
    15 years 10 months ago
    Testing a system-on-a-chip with embedded microprocessor
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    Rochit Rajsuman
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    ITC
    1999
    IEEE
    66views Hardware» more  ITC 1999»
    High-level ATPG for Early Power Analysis
    15 years 10 months ago
    High-level ATPG for Early Power Analysis
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    Wolfgang Roethig
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    ITC
    1999
    IEEE
    98views Hardware» more  ITC 1999»
    Addressable test ports an approach to testing embedded cores
    15 years 10 months ago
    Addressable test ports an approach to testing embedded cores
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    Lee Whetsel
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    ITC
    1999
    IEEE
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    Delay testing of SOI circuits: Challenges with the history effect
    15 years 10 months ago
    Delay testing of SOI circuits: Challenges with the history effect
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    Eric MacDonald, Nur A. Touba
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    109
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    ITC
    1999
    IEEE
    66views Hardware» more  ITC 1999»
    Robust testability of primitive faults using test points
    15 years 10 months ago
    Robust testability of primitive faults using test points
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    Ramesh C. Tekumalla, Premachandran R. Menon
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