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ITC
1999
IEEE
66views Hardware» more  ITC 1999»
15 years 6 months ago
High-level ATPG for Early Power Analysis
Wolfgang Roethig
76
Voted
ITC
1999
IEEE
103views Hardware» more  ITC 1999»
15 years 6 months ago
Delay testing of SOI circuits: Challenges with the history effect
Eric MacDonald, Nur A. Touba
76
Voted
ITC
1999
IEEE
66views Hardware» more  ITC 1999»
15 years 6 months ago
Robust testability of primitive faults using test points
Ramesh C. Tekumalla, Premachandran R. Menon