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65

ITC
2000
IEEE

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Analysis of interconnect crosstalk defect coverage of test sets

15 years 1 months ago

Analysis of interconnect crosstalk defect coverage of test sets

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Yi Zhao, Sujit Dey

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54

ITC
2000
IEEE

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Analysis of failure sources in surface-micromachined MEMS

15 years 1 months ago

Analysis of failure sources in surface-micromachined MEMS

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Nilmoni Deb, Ronald D. Blanton

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70

ITC
2000
IEEE

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A domain coverage metric for the validation of behavioral VHDL descriptions

15 years 1 months ago

A domain coverage metric for the validation of behavioral VHDL descriptions

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Qiushuang Zhang, Ian G. Harris

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50

ITC
2000
IEEE

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Using on-chip test pattern compression for full scan SoC designs

15 years 1 months ago

Using on-chip test pattern compression for full scan SoC designs

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Helmut Lang, Jens Pfeiffer, Jeff Maguire

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58

ITC
2000
IEEE

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Power conscious test synthesis and scheduling for BIST RTL data paths

15 years 29 days ago

Power conscious test synthesis and scheduling for BIST RTL data paths

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Nicola Nicolici, Bashir M. Al-Hashimi

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