28 search results - page 3 / 6 » itc 2000 |
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
Boards have evolved into complex systems and even collections of interacting systems. Test engineers struggle to find out how these systems are initialized and booted because of p...
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretica...
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
ITC
2000
IEEE
15 years 1 months ago
2000
IEEE
In this paper we present a design for IEEE 1149.1 Test Access Port (TAP)controllers that is based on a practical reuse methodology. While the basic use and core functionality of T...