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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
121
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
The IEEE 1149.6 standard was approved in March of 2003. The standard extends the capability of the IEEE 1149.1 standard to include AC-coupled and/or differential nets. These nets ...
144
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
122
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
117
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper we analyze the effects of transient faults (TFs) affecting the internal nodes of conventional latch structures and we propose a new latch design which allows to tole...