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152
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Functional verification of complex designs largely relies on the use of simulation in conjunction high-level verification languages (HVL) and test-bench automation (TBA) tools. In...
118
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
120
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
123
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Today’s low cost wireless phones have driven a need to be able to economically test high volumes of complex RF IC’s at a fraction of the cost of the IC. In June of 2001 the IB...
120
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...