106 search results - page 19 / 22 » itc 2003 |
143
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...
238
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
137
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
When developing new designs, debugging the prototype is important to resolve application malfunction. During this board design debug, often a few pins of an IC are measured to che...
137
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
116
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
A scalable laser-based timing analysis technique we call laser assisted device alteration (LADA) is introduced for the rapid isolation and analysis of defect-free performance limi...