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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to furth...
ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper presents a technique to improve verification at the VHDL level of digital circuits by means of a specially designed fault injection block. The injection technique allow...
123
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This work discusses the impact of power consumption on the test time of core-based systems, when an available on-chip network is reused as test access mechanism. A previously prop...
105
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Prior to the mid 1980s, the dominance of through-hole packaging of integrated circuits (ICs) provided easy access to nearly every pin of every chip on a printed circuit board. Pro...
138
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
An open architecture tester allows a third party to develop its own instrument. Such a tester must be open in the sense that it needs to be able to integrate this instrument with ...