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71
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DATE
2003
IEEE
118views Hardware» more  DATE 2003»
15 years 2 months ago
Multi-Granularity Metrics for the Era of Strongly Personalized SOCs
This paper details the first step of the Design Trotter framework for design space exploration applied to dedicated SOCs. The aim of this step is to provide metrics in order to gu...
Yannick Le Moullec, Nahla Ben Amor, Jean-Philippe ...
HICSS
2003
IEEE
105views Biometrics» more  HICSS 2003»
15 years 2 months ago
Experimental Validation of Multidimensional Data Models Metrics
Multidimensional data models are playing an increasingly prominent role in support of day-to-day business decisions. Due to their significance in taking strategic decisions it is ...
Manuel A. Serrano, Coral Calero, Mario Piattini
VTS
2003
IEEE
88views Hardware» more  VTS 2003»
15 years 2 months ago
Use of Multiple IDDQ Test Metrics for Outlier Identification
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
Sagar S. Sabade, D. M. H. Walker
ICSE
2003
IEEE-ACM
15 years 9 months ago
Improving UML Support for User Interface Design: A Metric Assessment of UMLi
The Unified Modeling Language (UML) has been widely accepted by application developers, but not so much by user interface (UI) designers. For this reason, the Unified Modeling Lan...
Paulo Pinheiro da Silva, Norman W. Paton
72
Voted
NIPS
2003
14 years 11 months ago
Applying Metric-Trees to Belief-Point POMDPs
Recent developments in grid-based and point-based approximation algorithms for POMDPs have greatly improved the tractability of POMDP planning. These approaches operate on sets of...
Joelle Pineau, Geoffrey J. Gordon, Sebastian Thrun