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DAC
2005
ACM
14 years 11 months ago
2005
ACM
Capturing RLCK circuit responses accurately with existing model order reduction (MOR) techniques is very expensive. Direct metrics for fast analysis of RC circuits exist but there...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
In this paper, we propose a new sensitivity based, statistical gate sizing method. Since circuit optimization effects the entire shape of the circuit delay distribution, it is dif...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
With 90nm CMOS in production and 65nm testing in progress, power has been pushed to the forefront of design metrics. This paper will outline practical techniques that are used to ...
LREC
2008
14 years 11 months ago
2008
Evaluation of Machine Translation (MT) technology is often tied to the requirement for tedious manual judgments of translation quality. While automated MT metrology continues to b...
COMCOM
2006
14 years 9 months ago
2006
The necessity of network traffic monitoring and analysis is growing dramatically with increasing network usage demands from individual users as well as business communities. Most ...