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84
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MR
2002
71views Robotics» more  MR 2002»
15 years 23 days ago
Zapping thin film transistors
N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan
72
Voted
MR
2002
75views Robotics» more  MR 2002»
15 years 23 days ago
DRAM reliability
Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin ...
87
Voted
MR
2002
318views Robotics» more  MR 2002»
15 years 23 days ago
Selected failure mechanisms of modern power modules
This paper reviews the main failure mechanisms occurring in modern power modules paying special attention to insulated gate bipolar transistor devices for high-power applications....
Mauro Ciappa
MR
2002
103views Robotics» more  MR 2002»
15 years 23 days ago
ESD protection design for CMOS RF integrated circuits using polysilicon diodes
ESD protection design for CMOS RF integrated circuits is proposed in this paper by using the stacked polysilicon diodes as the input ESD protection devices to reduce the total inp...
Ming-Dou Ker, Chyh-Yih Chang
84
Voted
MR
2002
63views Robotics» more  MR 2002»
15 years 23 days ago
Transient thermal analysis of multilayered structures using Green's functions
This paper presents an approach to the analysis of transient thermal states in electronic circuits using an analytical solution of the heat equation. Fully three-dimensional analy...
Marcin Janicki, Gilbert De Mey, Andrzej Napieralsk...