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    2007
    127views Robotics» more  MR 2007»
    A comprehensive model for PMOS NBTI degradation: Recent progress
    14 years 10 months ago
    A comprehensive model for PMOS NBTI degradation: Recent progress
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    Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...
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    MR
    2007
    102views Robotics» more  MR 2007»
    Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
    14 years 10 months ago
    Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
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    Z. Tang, P. D. Ye, D. Lee, C. R. Wie
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    MR
    2007
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    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
    14 years 10 months ago
    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
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    The development of a simplified analytical model to describe the thermal history of a Printed Circuit Board assembly (PCA) during convective reflow soldering is described in this ...
    Nele Van Steenberge, Paresh Limaye, Geert Willems,...
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    MR
    2007
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    Cohesive zone modeling for structural integrity analysis of IC interconnects
    14 years 10 months ago
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    Download  www.mate.tue.nl
    Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
    B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee...
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    MR
    2007
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    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    14 years 10 months ago
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    Download  www.ics.ee.nctu.edu.tw
    CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
    Shih-Hung Chen, Ming-Dou Ker
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