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149
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DATE
2008
IEEE
16 years 9 days ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
183
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ICCCN
2008
IEEE
16 years 8 days ago
2008
IEEE
—We investigate the p-percent coverage problem in this paper and propose two algorithms to prolong network lifetime based on the fact that for some applications full coverage is ...
149
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ICTAI
2008
IEEE
16 years 7 days ago
2008
IEEE
We propose an Integer Programming (IP) framework to undertake the dedicated photolithography machine constraint in semiconductor manufacturing. The constraint is one of the new ch...
177
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ISVLSI
2008
IEEE
16 years 7 days ago
2008
IEEE
Intelligent mobile information devices require lowpower and high-performance processors. In order to reduce energy consumption with maintaining computing performance, we proposed ...
151
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WSC
2008
15 years 8 months ago
2008
This study evaluates appointment systems used in hospitals by incorporating appointment rules and patient characteristics. Using an experiment unit at an internal medicine departm...