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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
16 years 4 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
ACMIDC
2008
15 years 6 months ago
Developing a multi-user virtual environment for adolescent psychotherapy
This paper discusses the early use of a prototype multiuser virtual environment (MUVE) designed to enhance traditional, office-based adolescent psychotherapy. Keywords Multi-playe...
Daniel Gillette
WSC
2008
15 years 6 months ago
Determining an appropriate number of FOUPs in semiconductor wafer fabrication facilities
In this paper, multiple orders per job type formation and release strategies are described for semiconductor wafer fabrication facilities (wafer fabs). Different orders are groupe...
Jens Zimmermann, Scott J. Mason, John W. Fowler, L...
WSC
2008
15 years 6 months ago
Controls: Emulation to improve the performance of container terminals
Nowadays container terminals are struggling with a continuously increasing volume. Therefore, they are searching for solutions to increase throughput capacity without expanding th...
Csaba A. Boer, Yvo Saanen
WSC
2008
15 years 6 months ago
A comparative study of genetic algorithm components in simulation-based optimisation
In this paper, we present a comparative study of different stochastic components of genetic algorithms for simulationbased optimisation of the buffer allocation problem. We explor...
Birkan Can, Andreas Beham, Cathal Heavey