2056 search results - page 266 / 412 » time 2000 |
155
Voted
ITC
2000
IEEE
15 years 9 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
125
Voted
JDM
2000
15 years 5 months ago
2000
Advanced Traveler Information Systems (ATIS) require e cient information retrieval and updating in a dynamic environment at di erent geographical scales. ATIS applications are use...
151
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ATS
2000
IEEE
15 years 10 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
155
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INFOCOM
2000
IEEE
15 years 10 months ago
2000
IEEE
Abstract—The innovative techniques of TCP Vegas have been the subject of much debate in recent years. Several studies have reported that TCP Vegas provides better performance tha...
159
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WSC
2000
15 years 7 months ago
2000
Web-based study resources can be viewed as a basic requirement in order to remain a competitive player on a more and more globalised educational market. For that reason it is gett...