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TVLSI
2008
106views more  TVLSI 2008»
14 years 10 months ago
Efficient Distributed On-Chip Decoupling Capacitors for Nanoscale ICs
Abstract--A distributed on-chip decoupling capacitor network is proposed in this paper. A system of distributed on-chip decoupling capacitors is shown to provide an efficient solut...
Mikhail Popovich, Eby G. Friedman, Radu M. Secarea...
TVLSI
2008
74views more  TVLSI 2008»
14 years 10 months ago
Stack Sizing for Optimal Current Drivability in Subthreshold Circuits
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors in...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
84
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TVLSI
1998
81views more  TVLSI 1998»
14 years 9 months ago
Maximum power estimation for CMOS circuits using deterministic and statistical approaches
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to efï...
Chuan-Yu Wang, Kaushik Roy
70
Voted
TVLSI
1998
83views more  TVLSI 1998»
14 years 9 months ago
Low overhead fault-tolerant FPGA systems
— Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability...
John Lach, William H. Mangione-Smith, Miodrag Potk...
59
Voted
TVLSI
1998
95views more  TVLSI 1998»
14 years 9 months ago
Bounds on pseudoexhaustive test lengths
Abstract—Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we ...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...