Abstract—We introduce a technique for on-line built-in selftesting (BIST) of bus-based field programmable gate arrays (FPGA’s). This system detects deviations from the intende...
N. R. Shnidman, William H. Mangione-Smith, Miodrag...
Switching activity-generated power-supply grid-noise presents a major obstacle to the reduction of supply voltage in future generation semiconductor technologies. A popular techniq...
This paper presents an irredundant encoding technique to minimize the switching activity on a multiplexed Dynamic RAM (DRAM) address bus. The DRAM switching activity can be classif...
Concurrent error detection (CED) based on time redundancy entails performing the normal computation and the re-computation at different times and then comparing their results. Time...
Simultaneous switching noise (SSN) has become an important issue in the design of the internal on-chip power distribution networks in current very large scale integration/ultra lar...