289 search results - page 48 / 58 » vlsi 2007 |
96
Voted
ICCAD
2007
IEEE
15 years 9 months ago
2007
IEEE
While the increasing need for addressing process variability in sub-90nm VLSI technologies has sparkled a large body of statistical timing and optimization research, the realizati...
86
Voted
ASAP
2007
IEEE
15 years 6 months ago
2007
IEEE
With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip and multicore architect...
101
click to vote
DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
114
click to vote
DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, vari...
86
Voted
DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...