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VLSID
2001
IEEE
15 years 10 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
VLSID
2001
IEEE
15 years 10 months ago
2001
IEEE
Since battery life directly impacts the extent and duration of mobility, one of the key considerations in the design of a mobile embedded system should be to maximize the energy d...