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VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
In this paper, we explore the concept of using analytical models to efficiently generate delay change curves (DCCs) that can then be used to characterize the impact of noise on an...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
Directed test program-based verification or formal verification methods are usually quite ineffective on large cachecoherent, non-uniform memory access (CC-NUMA) multiprocessors b...
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
Embedded DRAM (eDRAM) power-energy estimation is presented for system-on-a-chip (SOC) applications. The main feature is the signal swing based analytic (SSBA) model, which improve...