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VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
Abstract-- Power has become a major concern for mobile computing systems such as laptops and handhelds, on which a significant fraction of software usage is interactive instead of ...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
In this paper, we describe NoCGEN, a Network On Chip (NoC) generator, which is used to create a simulatable and synthesizable NoC description. NoCGEN uses a set of modularised rou...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...