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VLSID
2008
IEEE
15 years 10 months ago
2008
IEEE
Technology scaling has resulted in an exponential increase in the leakage power as well as the variations in leakage power of fabricated chips. Functional units (FUs), like Intege...
VLSID
2008
IEEE
15 years 10 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
VLSID
2008
IEEE
15 years 4 months ago
2008
IEEE
With the shift towards deep sub-micron (DSM) technologies, the increase in leakage power and the adoption of poweraware design methodologies have resulted in potentially significa...
VLSID
2008
IEEE
15 years 4 months ago
2008
IEEE
The last decade has seen a phenomenal increase in the use of electronic components in automotive systems, resulting in the replacement of purely mechanical or hydraulic-implementa...
VLSID
2008
IEEE
15 years 4 months ago
2008
IEEE
It is well-known that varying architectural, technological and implementation aspects of embedded microprocessors, such as ARM, can produce widely differing performance and power ...