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VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
65
Voted
VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
66
Voted
VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
77
Voted
VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
We present a test methodology to allow testing high-speed circuits with low-speed ATEs. The basic strategy is adding an interface circuit to partially supply test data, coordinate...
76
Voted
VTS
2002
IEEE
15 years 3 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...