As process technology continues to shrink, interconnect current densities continue to increase, making it ever more difficult to meet chip reliability targets. For microprocessors...
Due to the dramatic increase in design complexity, verifying the functional correctness of a circuit is becoming more difficult. Therefore, bugs may escape all verification effo...
The extent to which the 6T SRAM bit cell can be perpetuated through continued scaling is of enormous technological and economic importance. Understanding the growing limitations i...
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
Taniya Siddiqua, Sudhanva Gurumurthi, Mircea R. St...
Software process models are sophisticated and large specifications aimed at organizing and managing software development. Their formal specification demands an enormous effort,...
—Static cache analysis for data allocated on the heap is practically impossible for standard data caches. We propose a distinct object cache for heap allocated data. The cache is...
— The last two decades have seen many efficient algorithms and architectures for the design of low-complexity bit-parallel Multiple Constant Multiplications (MCM) operation, tha...
— we present an implementation of a programmable axonal propagation delay circuit which uses one first-order logdomain low-pass filter. Delays may be programmed in the 550ms rang...
Runchun Wang, Craig T. Jin, Alistair McEwan, Andr&...
— A switched-capacitor single-stage sigma-delta ADC with a fifth-order modulator is proposed. The proposed sigmadelta ADC employs feed-forward architecture with oversampling rati...