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127
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IOLTS
2003
IEEE
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IOLTS 2003
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Power Consumption of Fault Tolerant Codes: the Active Elements
15 years 8 months ago
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On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
Daniele Rossi, Steven V. E. S. van Dijk, Richard P...
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