Sciweavers

DATE
2002
IEEE
154views Hardware» more  DATE 2002»
14 years 10 days ago
Low Power Error Resilient Encoding for On-Chip Data Buses
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
Davide Bertozzi, Luca Benini, Giovanni De Micheli
DATE
2010
IEEE
162views Hardware» more  DATE 2010»
14 years 14 days ago
Error resilience of intra-die and inter-die communication with 3D spidergon STNoC
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
Vladimir Pasca, Lorena Anghel, Claudia Rusu, Ricca...
ISCA
2005
IEEE
147views Hardware» more  ISCA 2005»
14 years 29 days ago
Interconnections in Multi-Core Architectures: Understanding Mechanisms, Overheads and Scaling
This paper examines the area, power, performance, and design issues for the on-chip interconnects on a chip multiprocessor, attempting to present a comprehensive view of a class o...
Rakesh Kumar, Victor V. Zyuban, Dean M. Tullsen
DSN
2006
IEEE
14 years 1 months ago
Exploring Fault-Tolerant Network-on-Chip Architectures
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
Dongkook Park, Chrysostomos Nicopoulos, Jongman Ki...
VLSID
2002
IEEE
116views VLSI» more  VLSID 2002»
14 years 7 months ago
Efficient Macromodeling for On-Chip Interconnects
The improved T and improved n models are proposed for onchip interconnect macromodeling. Using global approximations, simple approximation frames are derived and applied to modeli...
Qinwei Xu, Pinaki Mazumder
DAC
2003
ACM
14 years 8 months ago
A survey of techniques for energy efficient on-chip communication
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
Vijay Raghunathan, Mani B. Srivastava, Rajesh K. G...