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TIP
2008
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TIP 2008
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Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
15 years 3 months ago
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Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
François Aguet, Dimitri Van De Ville, Micha...
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