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61
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MVA
2007
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Computer Vision
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MVA 2007
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Periodic Pattern Inspection Using Convolution Masks
15 years 4 months ago
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b2.cvl.iis.u-tokyo.ac.jp
A two-dimensional (2-D) convolution mask is proposed for detecting the location of irregularities and defects in a periodic two-dimensional signal or image. In this approach, defe...
Y. S. Weng, Ming-Hwei Perng
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