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126
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ICCD
2006
IEEE
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ICCD 2006
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A New Class of Sequential Circuits with Acyclic Test Generation Complexity
15 years 8 months ago
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iccd.et.tudelft.nl
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
Chia Yee Ooi, Hideo Fujiwara
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