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117
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ITC
1997
IEEE
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ITC 1997
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Fault Diagnosis in Scan-Based BIST
15 years 7 months ago
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ismet.bayraktaroglu.org
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
Janusz Rajski, Jerzy Tyszer
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