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GLVLSI
2003
IEEE
161
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VLSI
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GLVLSI 2003
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TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
15 years 8 months ago
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www.cs.york.ac.uk
The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
Timm Ostermann, Bernd Deutschmann
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