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    ATS
    1995
    IEEE
    91views Hardware» more  ATS 1995»
    Deterministic test generation for non-classical faults on the gate level
    15 years 27 days ago
    Deterministic test generation for non-classical faults on the gate level
    Download  www.tet.uni-hannover.de
    Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
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