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109
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ATS
1999
IEEE
99
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ATS 1999
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An Embedded Core DFT Scheme to Obtain Highly Compressed Test Sets
15 years 10 months ago
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cadal.cse.nsysu.edu.tw
Abhijit Jas, Kartik Mohanram, Nur A. Touba
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115
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ATS
1999
IEEE
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ATS 1999
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Defining SRAM Resistive Defects and Their Simulation Stimuli
15 years 10 months ago
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ce.et.tudelft.nl
A. J. van de Goor, J. E. Simonse
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