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105
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VLSID
2002
IEEE
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VLSID 2002
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Degree-of-Freedom Analysis for Sequential Machines Targeting BIST Quality and Gate Area
16 years 3 months ago
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www.cs.york.ac.uk
| This paper reports the design of BIST structures for sequential machines. Testability of an FSM is limited due to the fact that some machine states remain unreachable and some ac...
Samir Roy, Biplab K. Sikdar, Monalisa Mukherjee, D...
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