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109
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DDECS
2006
IEEE
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DDECS 2006
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Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
15 years 9 months ago
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eprints.nuim.ie
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
Guoyan Zhang, Ronan Farrell
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