115
Voted
ISSRE
2010
IEEE
14 years 11 months ago
2010
IEEE
Abstract—As smart phones grow in popularity, manufacturers are in a race to pack an increasingly rich set of features into these tiny devices. This brings additional complexity i...
109
Voted
ICST
2010
IEEE
14 years 11 months ago
2010
IEEE
—Although many static-analysis techniques have been developed for automatically detecting bugs, such as null dereferences, fewer automated approaches have been presented for anal...