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107
Voted
ISVLSI
2008
IEEE
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ISVLSI 2008
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Cache Power Reduction in Presence of Within-Die Delay Variation Using Spare Ways
15 years 9 months ago
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qir.kyushu-u.ac.jp
The share of leakage in cache power consumption increases with technology scaling. Choosing a higher threshold voltage (Vth) and/or gate-oxide thickness (Tox) for cache transistor...
Maziar Goudarzi, Tadayuki Matsumura, Tohru Ishihar...
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